ETSerdes - Embedded SerDes Test
The explosive adoption of high speed serial data links and the proliferation of multi-lane SerDes channels have created a new set of challenges for semiconductor design and test teams. These multi-Gbps low voltage differential signaling (LVDS) channels are proliferating in many standard forms, including PCI express, Gbit Ethernet, Serial ATA, RapidIO, Fiber Channel and Infiniband to name just a few.
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LogicVision, Inc.
101 Metro Drive
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