Dual Die Shelf Card (DDSC)
To meet requirements for higher throughput testing, Probe 2000 has created a new type of probe card for testing state-of-the-art semiconductor devices. Developed in partnership with our customers, the Dual Die Shelf Card enables more efficient probing of a multidie DUT. Using a cantilever-style needle arrangement, the DDSC can simultaneously probe 2 DUTs in a diagonal or an inline pattern, with pads on all four sides of the die. Probe 2000's in-house mechanical engineering team designs custom rings and fixtures, to evenly and accurately control probe force at all contact points of the die.
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Probe 2000
1015 East Brokaw
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