Diverse Analytical Capability
Together with the Analytical Services Group, our on-site sister organization, the IBM Microelectronics Test Solutions Center can provide complete analysis of semiconductor failure modes that utilize a large variety of diagnosis and analytical techniques. Combining Test with Failure Analysis capability puts a complete IC analysis team at your service. Even the most difficult ASIC, Microprocessor or Mixed Signal failure modes can be quickly resolved by utilizing the unique tools and services available only at our combined facility.
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IBM Microelectronics Test Solutions
2070 Route 52, M/S 5F1, Dept. 206A
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