DUOTECH

High-speed 24-second testing (7.5-μ resolution, 460 x 600 mm). Minimum L&S: 50 & 50 μ. Equipped with reflective and fluorescent camera (LED illumination). Automatic alignment (for X, Y and Theta). Testing by netlist comparison and bitmap list comparison. CAM data linkage (netlist and bitmap list). Can handle low-contrast materials. Easy operation, high-speed setup (common setup)