DIAMOND 40 - IC Test System

The Diamond 40 (D-40) test system combines analog, digital, mixed signal, and RF test instrumentation to support a wide range of consumer IC device testing. Incorporating Credence's proprietary MVNA? (Modulated Vector Network Analysis) technology, the Diamond 40 adds wireless test capabilities for mobile phone, WLAN, WiMAX and ZigBee devices.

Credence Systems Corporation

1421 California Circle
Milpitas, CA 95035
USA

Related Searches:

Mixed Signal Test

,

IC Test Systems

,

In-circuit Test Systems

,

System Level Test

,

EMI Test Systems

,

Signal Conditioning Systems

,

ESD Test Systems

,

Multi-Layer Network Test

,

VXI Test Systems

,

System Test

,

Component Test Systems

,

Test Systems

,

Broadband Test Systems

,

Network Test

,

Memory Test System



Welcome