The Air Coplanar Probe was developed in response to the need for a rugged microwave probe with a compliant tip for accurate, repeatable measurements on-wafer. Air Coplanar Probes feature excellent probe-tip visibility and the lowest loss available. For measurements where pad area is at a premium, the ACP family is offered with a reduced contact (RC) area probe tip. The ACP probe family also features Dual signal line versions for differential and multiport measurements. Combining outstanding electrical performance with precise probe mechanics, the ACP probe is the most widely used microwave probe available.
