AQ7410B High-resolution Reflectometer

The AQ7410B is a Michelson interferometer based high-resolution reflectometer. It produces high spatial resolution (20 µm) for 1310 nm and 1550 nm. The measurement distance has dramatically increased, up to 2000 mm in air.

Yokogawa Corporation of America

2 Dart Rd
Newnan, GA 30265
USA

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