1296A Dielectric Interface

Analyzing low conductivity, low loss materials stretches the capabilities of even the best frequency response analyzers (FRAs). Used alone, they lack the sensitivity required for accurate measurements, especially at low frequencies. When used in conjunction with one of our FRAs, the 1296A Dielectric Interface overcomes these issues allowing fast, accurate impedance measurements from 100ohm to 100Tohm with 1 in 65,000,000 resolution. In addition, the dissipation factor of low loss materials can be characterized with accurate tan delta measurements of less than 10-4.

Solartron Analytical

801 South Illinois Avenue
Oak Ridge, TN 37831
USA

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