Advantest Products
Advantest
manufacturing, selling and servicing the semiconductor industry's most accurate and reliable testers for memory, logic and mixed-signal devices.
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U3641/U3641N - Spectrum analyzer Send To Colleague The U3641/3641N is a 3-GHz synthesized spectrum analyzer ideal for field use. With a lightweight, compact size and threeway power supply including battery operation, the U3641/ 3641N has been designed specifically for field installation and maintenance applications. ...more -
U3661 - Spectrum analyzer Send To Colleague The U3661 is a microwave spectrum analyzer with the measurement frequency range expanded to 26.5GHz as well as the inherited features of the U3641 including the compact body, and battery operation. ...more -
T5501 - Memory Test System Send To Colleague The T5501 memory test system provides broad support from design, to characterization, to production for high-speed memory devices, such as GDDR3/4-SDRAM devices utilized for high-speed high-definition graphics, SRAMs used in high-speed internet routers, and the new generation of DDR3-SDRAMs that are increasing the memory capacity of PCs. ...more -
T5587 - Memory Test System Send To Colleague The T5587 is able to meet this demand with its enhanced flash memory testing function and high throughput, capable of a maximum testing rate of 400 Mbps and simultaneously testing up to 512 devices. ...more -
T5588 - Memory Test System Send To Colleague The T5588 meets such market demands with a maximum testing rate of 800 Mbps and by allowing the simultaneous testing of up to 512 devices. This enables high throughput testing at greatly reduced costs. T5588 is also the first DRAM package tester to offer an optional flash memory test function, making it uniquely adaptable to changing market co ...more -
T5593 - Memory Test System Send To Colleague The T5593 lowers the cost of at-speed test by supporting up to 256 devices simultaneous testing, Hifix exchange only by a socket board unit, and a new high-throughput calibration technology. Moreover, yield improvement is realized in combination with our handlers with Thermal Compensation Technology. This tester and handler combination is the ...more -
T5761/T5761ES - Memory Test System Send To Colleague The T5761 memory test system answers these calls with significant reductions in test time, and with its 512-device parallel test capability, per-site architecture, Error Code Correction (ECC), and real-time test programming functionality, the system also affords greatly reduced test costs. ...more -
T6372/6362 - LCD Driver Test System Send To Colleague Achieves simultaneous testing of up to four devices, and are capable of testing driver ICs with 10-bit resolution (1024 gradations). The T6372/6362 are the newest LCD driver test systems capable of testing at with high throughput, with and high accuracy, at low cost. ...more -
T6575/6565/6535 - VLSI Test System Send To Colleague The T6575/6565/6535 achieves significantly higher driver voltage than that of the T6500 series. Therefore, stress tests can be easily performed. Further, by adding an optional high voltage power supply, the T6575/6565/6535 can also perform blown fuse and high stress voltage tests, the specialty of the T3300 series test systems. Therefore, the ...more -
T6577 - SoC Test System Send To Colleague The T6577 is an SoC test system offering support for a maximum of 1024 logic and/or I/O channels. It can perform parallel test (OS parallel test) of up to 32 devices, and allows an exceptional range of parallel test functionality, such as flexible pin assignments and testing odd numbers of devices. It will greatly contribute to lowering the cos ...more -
T7721 - Advanced Mixed signal Test System Send To Colleague To satisfy a diversification of applications, linear/mixed signal devices have been developing to process data faster, have more advanced functions, and be more accurate. On the other hand, consumer devices require cost reduction. The T7721 adopts test unit with advanced technologies to meet customer needs with superior cost performance in eval ...more -
T7722 - Advanced Mixedsignal Test System Send To Colleague SoC devices are advancing at a high pace toward lower voltage, higher power, and higher speed. Thereby, linear or mixed-signal devices are required to operate stably with little adverse effect from noise generated by high speed clock signals. The T7722 is able to achieve floor space reduction by 20% compared with our conventional test systems, ...more -
T8571 - Image sensor Test System Send To Colleague In the Age of Mega-pixels and High Speed, Image sensors are tested at High Speed with low cost test systems. As digital still cameras and camera equipped mobile phones become commercially popular, imagesensor devices are proliferating with higher pixel density and more advanced functions. ...more -
U3741 - Spectrum Analyzer Send To Colleague Wireless LAN networks, cellular telephones, contactless smart cards, terrestrial digital broadcasts - all of them have become a part of our daily lives, and all of them use high-frequency wireless technology. Diversifying applications and expanding demand for communications devices have exacerbated competition in the market, placing manufacture ...more -
U3751 - Spectrum Analyzer Send To Colleague The U3751 is an 8 GHz, portable spectrum analyzer that responds to a wide variety of demands covering production line to maintenance applications. The main unit weighs 5.6 kgs. or less and is designed to save space. The U3751 is twice as fast as the previous model, and is equipped with features such as LAN, designed specifically for the produc ...more -
U3771/U3772 - Spectrum Analyzer Send To Colleague The U3771/U3772 sets a new standard for microwave spectrum analyzers. An analyzer that combines portability, a quality required for inspecting and servicing different types of communication systems, with maximum functionality in the field. ...more -
FutureSuite - System Software Send To Colleague You can select from either the latest MCI language or the proven ATL language, achieving a single platform from which to accomplish software development, evaluation, analysis and production. With thousands of systems installed world-wide, these languages set the standard for memory testing today ...more -
M4543A - Dynamic Test Handler Send To Colleague The M4543A offers an effective solution to heat generation during test by implementing dynamic thermal control. The M4543A responsively heats or cools the device under test, maintaining thermal specifications for devices which would otherwise have a wide temperature variance even in four-device parallel test. ...more -
M4551A - Dynamic Test Handler Send To Colleague The M4551A parallel-tests up to eight devices at room temperature and above. Its wide measurement bed enables it to adapt to device sizes or light source layouts more flexibly than conventional testers. Leveraging a device-handling mechanism with an established reputation for success, the M4551A optimizes motion control, attaining high through ...more -
M4741A - Dynamic Test Handler Send To Colleague The M4741A achieves solid contact with narrowpitch/ miniature devices with advanced functionality, such as those used in mobile equipment. Alignment using mechanical guidance is trending toward miniaturization and narrowing pitch, resulting in deterioration of contact performance. The M4741A, however, employs vision alignment to position socke ...more -
M4841 - Dynamic Test Handler Send To Colleague Unique in its class, Advantest's new M4841 Dynamic Test Handler enables high-throughput parallel test for very high volumes of devices and supports complex ICs and packages, including BGA, CSP and QFP. Because of its advanced performance capabilities and features, the M4841 is the optimal dynamic test handler for high volume production of devic ...more -
M6300 - Dynamic Test Handler Send To Colleague The M6300 offers a high-speed and flexible testing environment for these complex and variable devices, by incorporating a range of innovations including high-speed handling technology and a newly-developed contact mechanism. ...more -
M6542AD - Dynamic Test Handler Send To Colleague Optimized functions for testing next generation devices provides better environment for stable operation and yield improvement. Because new generation devices continue the trend of higher speed data transmission, such as DDR, their heat dissipation and thermal management becomes a significant test consideration. ...more -
M6771AD - Dynamic Test Handler Send To Colleague The M6771AD adopts high-speed handling technologies, and simultaneously tests 32/64 devices. The high throughput of up to 7200 devices per hour, achieves a greatly decreased test cost. The M6771AD reduces also machine index time to further boost productivity, by speed up of the test tray transfer system. ...more -
M7521A - Dynamic Test Handler Send To Colleague The performance of the driver ICs used in FPDs (flat panel displays) has undergone rapid improvement due to the advent of TAB (tape-automated bonding) and COF (chip on film) technologies. At the same time, chip density is also becoming greater. The M7521A TAB handler reliably handles these types of driver ICs to realize high throughput. ...more
